منابع مشابه
Carolyn K . Goldman , Philip Leder , And
The maturation of a pre-B cell to an immunoglobulin (Ig)-bearing B cell requires an effective recombination of a light chain variable (VL) 1 and joining (JL) gene segment (1-11). Man uses both light chain gene classes appreciably, expressing K light chain in -60% and ~ light chain in 40% of mature B cells. Despite their nearly equal usage, however, the rearrangement of human Ig light chain gene...
متن کاملTID Effect in SOI Technology
In this paper, a brief overview of TID effect in SOI technology is presented. The introduction of buried oxide(BOX) adds vulnerability to TID effect in SOI transistors because of its large thickness. Also the BOX introduces special charge traps, the delocalized spin centers, which in most cases are positive. The charge buildup in BOX could increase the leakage current in front gate transistor i...
متن کاملTiD - Documentation of TOBI Interface D
4 TiD Message 2 4.1 Structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 4.2 Version . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 4.3 Description . . . . . . . . . . . . . . . . . . ....
متن کاملA Lightweight Protocol to Robust TID-Based Anti-Counterfeiting
Electronic Product Code (EPC) Radio Frequency IDentification (RFID) tags support a costeffective anti-counterfeiting mechanism through the tag-specific and globally unique Transponder ID (TID). However, with the existence of customizable tags, this countermeasure could easily be bypassed as long as the TID codes are leaked through either physically opening genuine tags or unauthorizedly breachi...
متن کاملTID, SEE and Radiation Induced Failures in Advanced Flash Memories
We report on TID and SEE tests of multi-level and higher density flash memories. Stand-by currents and functionality tests were used to characterize the response of radiation-induced failures. The radiation-induced failures can be categorized as followings: SEU read errors during irradiation, stuck-bit read errors verified post-irradiation, write errors, erase failures, multiple upsets, and sin...
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ژورنال
عنوان ژورنال: Samtiden
سال: 2020
ISSN: 1890-0690,0036-3928
DOI: 10.18261/issn1890-0690-2020-01-01